Advanced mathematical & computational tools in metrology VI / editors, P. Ciarlini ... [et al.].

Format:

Book

Contributor:

Ciarlini, P.

Series:

Series on advances in mathematics for applied sciences ; v. 66.

Series on advances in mathematics for applied sciences ; v. 66

Language:

English

Subjects (All):

Measurement--Congresses.

Measurement.

Physical measurements--Congresses.

Physical measurements.

Physical Description:

1 online resource (367 p.)

Edition:

1st ed.

Place of Publication:

Singapore ; River Edge, NJ : World Scientific, c2004.

Language Note:

English

Summary:

This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia "G. Colonnetti" (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mat

Contents:

Foreword; Contents; Estimation of Precision and Uncertainty of a Calibration Artefact for CMMs S. D. Antunes and M. A. F. Vicente; Uncertainty in Semi-Qualitative Testing W. Bremser and W. Hasselbarth; Processing the Coherent Anomalies on Digitalized Surfaces in Wavelet Domain P. Ciarlini and M. L. Lo Cascio; Least Squares Adjustment in the Presence of Discrepant Data M. G. Cox, A. B. Forbes, J. L. Flowers and P. M. Harris; Harmonization of Correlated Calibration Curves with an Application to the Analysis of Natural Gases M. G. Cox, S. Kamvissis, M. J. T. Milton and G. Vargha

Parametrized Approximation Estimators for Mixed Noise Distributions D. P. Jenkinson, J. C. Mason, A. Crampton, M. G. Cox, A. B. Forbes and R. BoudjemaaAlgorithms for the Calibration of Laser-Plane Sensors on CMMs C. Lartigue, P. Bourdet, L. Mathieu and C. Mehdi-Souzani; Some Differences between the Applied Statistical Approach for Measurement Uncertainty Theory and the Traditional Approach in Metrology and Testing C. Perruchet; Metrology Software for the Expression of Measurement Results by Direct Calculation of Probability Distributions G. B. Rossi, F. Crenna and M. Codda

Feasibility Study of Using Bootstrap to Compute the Uncertainty Contribution from Few Repeated Measurements B. R. L. Siebert and P. CiarliniRecursive and Parallel Algorithms for Approximating Surface Data on a Family of Lines or Curves G. Allasia; Process Measurement Impact on the Verification Uncertainty J. Bachmann, J. M. Linares, S. Aranda and J. M. Sprauel; On the In-Use Uncertainty of an Instrument W. Bich and F. Pennecchi; Automatic Differentiation and Its Application in Metrology R. Boudjemaa, M. G. Cox, A. B. Forbes and P. M. Harris

Usage of Non-Central Probability Distributions for Data Analysis in Metrology A. ChunovkinaImplementation of a General Least Squares Method in Mass Measurements J. Hald and L. Nielsen; The GUM Tree Design Pattern for Uncertainty Software B. D. Hall; Statistical Hypotheses Testing for Phase Transition Identification in Cryogenic Thermometry D. Ichim, I. Peroni and F: Sparasci; The Impact of Entropy Optimization Principles on the Probability Assignment to the Measurement Uncertainty G. Iuculano, A. Zanobini and G. Pellegrini

Stochastic Processes for Modelling and Evaluating Atomic Clock Behaviour G. Panfilo, P. Tavella and C. ZuccaCompound-Modelling of Metrological Data Series F. Pavese; Homotopic Solution of EW-TLS Problems M. L. Rastello and A. Premoli; Pooled Data Distributions: Graphical and Statistical Tools for Examining Comparison Reference Values A. G. Steele, K. D. Hill and R. J. Douglas; Numerical Uncertainty Evaluation for Complex-Valued Quantities: A Case Example L. Callegaro, F. Pennecchi and W. Bich

Bayesian Approach to Quantum State Tomography S. Castelletto, I. P. Degiovanni, M. L. Rastello and I. Ruo Berchera

Notes:

Papers from the sixth workshop on the theme of advanced mathematical and computational tools in metrology, held at the Istituto di Metrologia "G. Colonnetti", Torino, Italy, September 2003.

Includes bibliographical references and index.

ISBN:

9786611898687

9781281898685

1281898686

9789812702647

9812702644

OCLC:

476063115