An assessment of the National Institute of Standards and Technology measurement and standards laboratories : fiscal year 1997 / Board on Assessment of NIST Programs, Commission on Physical Sciences, Mathematics, and Applications, National Research Council.

Format:

Book

Contributor:

National Research Council (U.S.). Board on Assessment of NIST Programs.

National Research Council (U.S.). Commission on Physical Sciences, Mathematics, and Applications.

Language:

English

Subjects (All):

Measurement--Standards--United States.

Measurement.

National Institute of Standards and Technology (U.S.)--Evaluation.

National Institute of Standards and Technology (U.S.).

Physical Description:

1 online resource (226 p.)

Edition:

1st ed.

Place of Publication:

Washington, D.C. : National Academy Press, 1997.

Language Note:

English

Contents:

""An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY PROGRAMS""; ""Copyright""; ""COMMISSION ON PHYSICAL SCIENCES, MATHEMATICS, AND APPLICATIONS""; ""Preface""; ""Contents""; ""Chapter 1 The State of the Laboratories ""; ""MERIT OF PROGRAMS""; ""IMPACT OF PROGRAMS""; ""RESOURCES""; ""Facilities""; ""Equipment""; ""Personnel""; ""Other-Agency Funding""; ""Security""; ""PLANNING""; ""MAJOR OBSERVATIONS""; ""Chapter 2 Electronics and Electrical Engineering Laboratory""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""

""Technical Merit and Appropriateness of the Work""""Industrial Impact""; ""Laboratory Resources""; ""Laboratory Planning""; ""DIVISIONAL REVIEWS""; ""Electricity Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Resources""; ""Planning""; ""Semiconductor Electronics Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Resources""; ""Planning""; ""Electromagnetic Fields Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Resources""; ""Planning""

""Electromagnetic Technology Division""""Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Resources""; ""Planning""; ""Optoelectronics Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Resources""; ""Planning""; ""Office of Microelectronics Programs""; ""Office of Law Enforcement Standards""; ""MAJOR OBSERVATIONS""; ""Chapter 3 Manufacturing Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""

""Laboratory Resources""""Laboratory Planning""; ""DIVISIONAL ASSESSMENTS""; ""Precision Engineering Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Resources""; ""Planning""; ""Automated Production Technology Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Resources""; ""Planning""; ""Intelligent Systems Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Resources""; ""Planning""; ""Manufacturing Systems Integration Division""; ""Mission""

""Technical Merit and Appropriateness of the Work""""Industrial Impact""; ""Resources""; ""Planning""; ""Fabrication Technology Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Resources""; ""Planning""; ""MAJOR OBSERVATIONS""; ""Chapter 4 Chemical Science and Technology Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Laboratory Resources""; ""Laboratory Planning""; ""DIVISIONAL ASSESSMENTS""; ""Biotechnology Division""; ""Mission""

""Technical Merit and Appropriateness of Work""

Notes:

Description based upon print version of record.

Includes bibliographical references.

OCLC:

726823351