X-ray scattering / Christopher M. Bauwens, editor.

Format:

Book

Contributor:

Bauwens, Christopher M.

Series:

Materials science and technologies series.

Materials science and technologies

Language:

English

Subjects (All):

Radiography, Industrial.

X-rays--Scattering.

X-rays.

Physical Description:

1 online resource (259 p.)

Edition:

1st ed.

Place of Publication:

New York : Nova Science Publishers, Inc., c2012.

Language Note:

English

Summary:

X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. In this book, the authors present current research in the study of X-ray scattering, including real-time synchrotron X-ray scattering, applications of X-ray scattering in edible lipid systems; X-ray scattering of bacterial cell wall compounds and their neutralization and small angle X-ray scattering analysis of nanomaterials for ultra large scale integrated circuits.

Contents:

GISAXS - probe of buried interfaces in multi-layered thin films / P. Siffalovic, M. Jergel, and E. Majkova

In situ, real-time synchrotron x-ray scattering / Bridget Ingham

Applications of x-ray scattering in edible lipid systems / Cristián Huck-Iriart, Noé Javier Morales-Mendoza, Roberto Jorge Candal and María Lidia Herrera

Small angle x-ray scattering analysis of nanomaterials for ultra large scale integrated circuits / T. K. S. Wong and T. K. Goh

X-ray scattering of bacterial cell wall compounds and their neutralization / Michael Rappolt, Manfred Rössle, Yani Kaconis, Jörg Howe, Jörg Andrä, Thomas Gutsmann, and Klaus Brandenburg

Decomposition of WAXS diffractograms of semicrystalline polymers by simulated annealing / Gopinath Subramanian and Rahmi Ozisik

Depth profile analysis of surface layer structure using x-ray diffraction and x-ray reflectivity at small glancing angles of incidence / Yoshikazu Fujii

SAXS/WAXS characterization of sol-gel derived nanomaterials / Gang Chen.

Notes:

Description based upon print version of record.

Includes bibliographical references and index.

Description based on print version record.

ISBN:

1-62417-506-6

OCLC:

923666794