Scanning probe microscopy of soft matter : fundamentals and practices / by Vladimir V. Tsukruk and Srikanth Singamaneni.

Format:

Book

Author/Creator:

T︠S︡ukruk, V. V. (Vladimir Vasilʹevich)

Contributor:

Singamaneni, Srikanth.

Language:

English

Subjects (All):

Scanning probe microscopy.

Soft condensed matter.

Physical Description:

1 online resource (664 p.)

Edition:

1st ed.

Place of Publication:

Weinheim : Wiley-VCH, c2012.

Language Note:

English

Summary:

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy,showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a widerange of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopyin soft matter research. From the contents:<

Contents:

Scanning Probe Microscopy of Soft Matter: Fundamentals and Practices; Contents; Preface; Part One: Microscopy Fundamentals; 1 Introduction; References; 2 Scanning Probe Microscopy Basics; 2.1 Basic Principles of Scanning Probe Microscopy; 2.2 Scanning Tunneling Microscopy; 2.3 Advent of Atomic Force Microscopy; 2.4 Overview of Instrumentation; 2.4.1 Scanners; 2.4.2 Microcantilevers as Force Sensors; 2.4.3 Electronic Feedback; 2.5 Probes and Cantilevers in Scanning Probe Microscopy; 2.5.1 Physical Attributes of Microcantilevers; 2.5.2 Tip Characterization; 2.5.3 Tip Modification

2.6 Modes of Operation2.6.1 Contact Mode; 2.6.2 Noncontact Mode and Tapping Mode; 2.7 Advantages and Limitations; References; 3 Basics of Atomic Force Microscopy Studies of Soft Matter; 3.1 Physical Principles: Forces of Interaction; 3.1.1 Long-Range Forces; 3.1.2 Short-Range Forces; 3.1.3 Other Forces of Interaction; 3.1.4 Resolution Criteria; 3.1.5 Scan Rates and Resonances; 3.2 Imaging in Controlled Environment; 3.2.1 AFM Imaging in Liquid; 3.2.2 AFM at Controlled Temperature; 3.2.3 Imaging in Controlled Humidity; 3.3 Artifacts in AFM Imaging of Soft Materials

3.3.1 Surface Damage and Deformation3.3.2 Tip Dilation; 3.3.3 Damaged and Contaminated Tip or Surface; 3.3.4 Noises and Vibrations; 3.3.5 Tip Artifacts; 3.3.6 Thermal Drift and Piezoelement Creep; 3.3.7 Oscillations and Artificial Periodicities; 3.3.8 Image Processing Artifacts; 3.4 Some Suggestions and Hints for Avoiding Artifacts; 3.4.1 Tip Testing and Deconvolution; 3.4.2 Force Control; 3.4.3 Tip Contamination and Cleaning; References; 4 Advanced Imaging Modes; 4.1 Surface Force Spectroscopy; 4.1.1 Introduction to Force Spectroscopy; 4.1.2 Force-Distance Curves; 4.1.3 Force Mapping Mode

4.2 Friction Force Microscopy4.3 Shear Modulation Force Microscopy; 4.4 Chemical Force Microscopy (CFM); 4.5 Pulsed Force Microscopy; 4.6 Colloidal Probe Microscopy; 4.7 Scanning Thermal Microscopy; 4.7.1 Thermal Resistive Probes and Spatial Resolution; 4.7.2 Localized Thermal Analysis; 4.7.3 Thermal Conductivity; 4.8 Kelvin Probe and Electrostatic Force Microscopy; 4.9 Conductive Force Microscopy; 4.10 Magnetic Force Microscopy; 4.11 Scanning Acoustic Force Microscopy; 4.11.1 Force Modulation; 4.11.2 Ultrasonic Force Microscopy; 4.12 High-Speed Scanning Probe Microscopy; References

Part Two: Probing Nanoscale Physical and Chemical Properties5 Mechanical Properties of Polymers and Macromolecules; 5.1 Elements of Contact Mechanics and Elastic Modulus; 5.1.1 General SFS Nanoprobing Principles; 5.1.2 Substrate Effects; 5.1.3 Issues and Key Assumptions with Nanomechanical Probing; 5.2 Probing of Elastic Moduli for Different Materials: Selected Examples; 5.2.1 Bulk Materials and Blends; 5.2.2 Ultrathin Polymer Films from Different Polymers; 5.2.3 Probing Individual Macromolecules; 5.3 Adhesion Measurements; 5.4 Viscoelasticity Measurements; 5.5 Friction

5.6 Unfolding of Macromolecules

Notes:

Description based upon print version of record.

Includes bibliographical references and index.

ISBN:

9783527639960

3527639969

9781283869812

1283869810

9783527639977

3527639977

9783527639953

3527639950

OCLC:

797919432