An assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories : fiscal year 1998 / Board on Assessment of NIST Programs, Commission on Physical Sciences, Mathematics, and Applications, National Research Council.

Format:

Book

Contributor:

National Research Council (U.S.). Board on Assessment of NIST Programs.

Language:

English

Subjects (All):

Laboratories--United States--Evaluation.

Laboratories.

National Institute of Standards and Technology (U.S.)--Evaluation.

National Institute of Standards and Technology (U.S.).

Physical Description:

1 online resource (232 p.)

Edition:

1st ed.

Place of Publication:

Washington, D.C. : National Academy Press, 1998.

Language Note:

English

Contents:

""An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES Fiscal Year 1998""; ""Copyright""; ""Preface""; ""Acknowledgment of Reviewers""; ""Contents""; ""Chapter 1 The State of the Laboratories""; ""MISSION""; ""TECHNICAL MERIT OF PROGRAMS""; ""IMPACT OF PROGRAMS""; ""Assessment of Impact""; ""Measurement of Performance and Impact""; ""Dissemination of Program Results""; ""RESOURCES""; ""Facilities""; ""Computing Facilities""; ""Human Resources""; ""Chapter 2 Electronics and Electrical Engineering Laboratory""; ""PANEL MEMBERS""

""LABORATORY-LEVEL REVIEW""""Laboratory Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Electricity Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Semiconductor Electronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Electromagnetic Fields Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""

""Impact of Programs""""Division Resources""; ""Electromagnetic Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Optoelectronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Office of Microelectronics Programs""; ""Office of Law Enforcement Standards""; ""MAJOR OBSERVATIONS""; ""Chapter 3 Manufacturing Engineering Laboratory""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""

""Technical Merit and Appropriateness of Work""""Impact of Programs""; ""Resources""; ""DIVISIONAL REVIEWS""; ""Precision Engineering Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Resources""; ""Automated Production Technology Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Resources""; ""Intelligent Systems Division""; ""Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Resources""; ""Manufacturing Systems Integration Division""; ""Mission""

""Technical Merit and Appropriateness of Work""""Impact of Programs""; ""Resources""; ""MAJOR OBSERVATIONS""; ""Chapter 4 Chemical Science and Technology Laboratory""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Biotechnology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Process Measurements Division""; ""Division Mission""

""Technical Merit and Appropriateness of Work""

Notes:

Description based upon print version of record.

OCLC:

58596361