Reliability and radiation effects in compound semiconductors / Allan Johnston.

Format:

Book

Author/Creator:

Johnston, Allan.

Language:

English

Subjects (All):

Compound semiconductors.

Physical Description:

1 online resource (376 p.)

Edition:

1st ed.

Place of Publication:

Hackensack, N.J. : World Scientific, 2010.

Language Note:

English

Summary:

This book discusses reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. Johnston's perspective in the book focuses on high-reliability applications in space, but his discussion of reliability is applicable to high reliability terrestrial applications as well. The book is important because there are new reliability mechanisms present in compound semiconductors that have produced a great deal of confusion. They are complex, and appear to be major stumbling blocks in the application of these types of devices. Many of the reliability p

Contents:

Preface; Acknowledgments; Contents; 1 Introduction; 2 Semiconductor Fundamentals; 3 Transistor Technologies; 4 Optoelectronics; 5 Reliability Fundamentals; 6 Compound Semiconductor Reliability; 7 Optoelectronic Device Reliability; 8 Radiation Environments; 9 Interactions of Radiation with Semiconductors; 10 Displacement Damage in Compound Semiconductors; 11 Displacement Damage in Optoelectronic Devices; 12 Radiation Damage in Optocouplers; 13 Effects from Single Particles; Index

Notes:

Description based upon print version of record.

Includes bibliographical references and index.

ISBN:

9786613143747

9781283143745

1283143747

9781615836871

161583687X

9789814277112

9814277118

OCLC:

701731809