Scanning force microscopy : with applications to electric, magnetic, and atomic forces / Dror Sarid.

Format:

Book

Author/Creator:

Sarid, Dror, author.

Series:

Oxford series in optical and imaging sciences ; 5.

Oxford scholarship online.

Oxford series in optical and imaging sciences ; 5

Oxford scholarship online

Language:

English

Subjects (All):

Scanning force microscopy.

Surfaces (Physics).

Physical Description:

1 online resource (xiii,263p. ) ill.

Edition:

Rev. ed.

Place of Publication:

New York ; Oxford University Press, 2023.

Language Note:

English

Summary:

Includes information about the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. This book also includes research in SFM and a bibliography. It will be useful for academic and industrial researchers using SFM.

Contents:

Intro

Contents

PREFACE TO THE REVISED EDITION

PREFACE

PART ONE. LEVERS AND NOISE

Chapter 1 Mechanical Properties of Levers

1.1. Introduction

1.2. Stress and Strain

1.3. Moments

1.4. Spring Constant

1.5. The Rayleigh Solution to a Vibrating Lever

1.6. The Classical Solution to a Vibrating Lever

1.7. Normal Modes

1.8. Lumped Systems

1.9. Examples

1.10. Summary

Chapter 2 Resonance Enhancement

2.1. Introduction

2.2. Bimorph Driver

2.3. Effective Spring Constant

2.4. Bimorph-Driven Lever

2.5. Sample-Driven Lever

2.6. Tip-Driven Lever

2.7. Summary

Chapter 3 Sources of Noise

3.1. Introduction

3.2. General Discussion of Noise

3.3. Shot Noise

3.4. Resistor Johnson Noise

3.5. Laser Intensity Noise

3.6. Laser Phase Noise

3.7. Thermally Induced Lever Noise

3.8. Bimorph Noise

3.9. Lever Noise-Limited SNR

3.10. Experimental Characterization of Noise

3.11. Summary

PART TWO. SCANNING FORCE MICROSCOPES

Chapter 4 Tunneling Detection System

4.1. Introduction

4.2. Theory

4.3. Perpendicular Arrangement

4.4. Cross Arrangement

4.5. Parallel Arrangement

4.6. Serial Arrangement

4.7. Single-Lever Arrangement

4.8. Summary

Chapter 5 Capacitance Detection System

5.1. Introduction

5.2. Theory

5.3. Noise Considerations

5.4. Performance of Systems

5.5. Summary

Chapter 6 Homodyne Detection System

6.1. Introduction

6.2. Theory

6.3. Noise Considerations

6.4. System Performance

6.5. Summary

Chapter 7 Heterodyne Detection System

7.1. Introduction

7.2. Theory

7.3. Noise Considerations

7.4. Performance

7.5. Summary

Chapter 8 Laser-Diode Feedback Detection System

8.1. Introduction

8.2. Theory

8.3. Noise Considerations

8.4. Performance

8.5. Summary.

Chapter 9 Polarization Detection System

9.1. Introduction

9.2. Theory

9.3. Noise Considerations

9.4. Performance

9.5. Summary

Chapter 10 Deflection Detection System

10.1. Introduction

10.2. Theory

10.3. Noise Considerations

10.4. Performance

10.5. Summary

PART THREE. SCANNING FORCE MICROSCOPY

Chapter 11 Electric Force Microscopy

11.1. Introduction

11.2. Basic Concepts

11.3. Examples

11.4. Principles of Operation

11.5. Noise Considerations

11.6. Applications

11.7. Performance

11.8. Summary

Chapter 12 Magnetic Force Microscopy

12.1. Introduction

12.2. Basic Concepts

12.3. Examples

12.4. Principles of Operation

12.5. Noise Considerations

12.6. Applications

12.7. Performance

12.8. Summary

Chapter 13 Atomic Force Microscopy

13.1. Introduction

13.2. Intermolecular Microscopic Interactions

13.3. Intermolecular Macroscopic Interactions

13.4. Lever-Tip-Sample Contact Interactions

13.5. Lever-Tip-Sample Noncontact Interactions

13.6. Experimental Results for the Contact Mode

References

Index.

Notes:

Previous edition: 1991.

Previously issued in print: 1994.

Includes bibliographical references and index.

Derived record based on print version record and publisher information.

ISBN:

0-19-773261-5

1-280-44178-X

0-19-802281-6

9786610441785

0-19-534469-3

1-60256-628-3

OCLC:

228117554