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GaN-based materials and devices : growth, fabrication, characterization and performance / editors, M.S. Shur, R.F. Davis.

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Format:
Book
Contributor:
Shur, Michael.
Davis, Robert F. (Robert Foster), 1942-
Series:
Selected topics in electronics and systems ; v. 33.
Selected topics in electronics and systems ; v. 33
Language:
English
Subjects (All):
Gallium nitride.
Semiconductors.
Physical Description:
1 online resource (295 p.)
Edition:
33th ed.
Place of Publication:
Singapore ; River Edge, N.J. : World Scientific, c2004.
Language Note:
English
Summary:
The unique materials properties of GaN-based semiconductors havestimulated a great deal of interest in research and developmentregarding nitride materials growth and optoelectronic andnitride-based electronic devices. High electron mobility andsaturation velocity, high sheet carrier concentration atheterojunction interfaces, high breakdown field, and low thermalimpedance of GaN-based films grown over SiC or bulk AlN substratesmake nitride-based electronic devices very promising.
Contents:
Preface; CONTENTS; Materials Properties of Nitrides. Summary; Kinetics, Microstructure and Strain in GaN Thin Films Grown Via Pendeo-Epitaxy; Strain of GaN Layers Grown Using 6H-SiC(0001) Substrates with Different Buffer Layers; Growth of Thick GaN Films and Seeds for Bulk Crystal Growth; Cracking of GaN Films; Direct Bonding of GaN and SiC; A Novel Technique for Electronic Device Fabrication; Electronic Properties of GaN (0001) - Dielectronic Interfaces; Transport and Noise Properties; Quasi-Ballistic and Overshoot Transport in Group III-Nitrides; High Field Transport in AIN
Generation-Recombination Noise in GaN-Based DevicesInsulated Gate III-N Heterostructure Field-Effect Transistors; High Voltage AIGaN/GaN Heterojunction Transistors; Etched Aperture GaN CAVET Through Photoelectrochemical Wet Etching; n-AlGaAs/p-GaAs/n-GaN Heterojunction Bipolar Transistor: The First Transistor Formed Via Wafer Fusion
Notes:
Description based upon print version of record.
Includes bibliographical references.
ISBN:
9786611347628
9781281347626
1281347620
9789812562364
9812562362
OCLC:
475932992

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