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ZuE 2015 : 8. GMM/ITG/GI-Symposium Reliability by Design : 21-23 September 2015.
- Format:
- Book
- Language:
- German
- Subjects (All):
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Design and construction--Congresses.
- Physical Description:
- 1 online resource (215 pages)
- Place of Publication:
- Frankfurt am Main, Germany : VDE, 2015.
- Notes:
- Description based on: online resource; title from title screen (IEEE Xplore Digital Library, viewed March 24, 2018).
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