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Proceedings / Applied Imagery Pattern Recognition Workshop.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available from 2000. Available online

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Format:
Conference/Event
Journal/Periodical
Contributor:
IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.
Conference Name:
Applied Imagery Pattern Recognition Workshop.
Standardized Title:
Proceedings (Online)
Language:
English
Subjects (All):
Optical pattern recognition--Congresses.
Optical pattern recognition.
Pattern recognition systems--Congresses.
Pattern recognition systems.
Image processing--Congresses.
Image processing.
Genre:
Conference papers and proceedings.
Physical Description:
volumes : illustrations ; 28 cm
Annual
Began with 29th (Oct. 16/18, 2000).
Continued By:
IEEE Applied Imagery Pattern Recognition Workshop
Place of Publication:
Los Alamitos, Calif. : IEEE Computer Society
Notes:
Title from journal fulltext screen (IEL Web site, viewed Jan. 3, 2005).
Vols. also have distinctive theme titles.
Sponsored by: IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.
Latest issue consulted: 37th (2008) (IEEE Xplore, viewed Aug. 27, 2009).
Constituent Unit:
Information Theory, 2004. ISIT 2004. Proceedings. International Symposium on
ISSN:
2332-5615
OCLC:
57372474

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