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2016 21st IEEE European Test Symposium (ETS) : ETS 2016 : May 23rd-26th 2016, Amsterdam, the Netherlands / Institute of Electrical and Electronics Engineers.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

IEEE Xplore (IEEE/IET Electronic Library - IEL)
Format:
Language:
English
Subjects (All):
Physical Description:
1 online resource : illustrations
Place of Publication:
Piscataway, NJ : IEEE, 2016.
Summary:
Annotation the scope of the conference is electronic based circuits and system testing, including VLSI Test, VLSI Reliability, Yield, diagnosis, DFX, Verification, etc.
Contents:
  • [Front cover]
  • [Blank page]
  • [Title page]
  • [Copyright notice]
  • ETS 2016 foreword
  • ETS 2016 organizing committee
  • ETS 2016 steering and program committees
  • ETS 2015 best paper
  • ETS 2016 sponsors
  • Securely connected vehicles - what it takes to make self-driving cars a reality
  • Compressor design for silicon debug
  • An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability.
Notes:
Description based on publisher supplied metadata and other sources.
ISBN:
1-4673-9659-1

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