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2016 21st IEEE European Test Symposium (ETS) : ETS 2016 : May 23rd-26th 2016, Amsterdam, the Netherlands / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Automatic test equipment--Congresses.
- Automatic test equipment.
- Physical Description:
- 1 online resource : illustrations
- Place of Publication:
- Piscataway, NJ : IEEE, 2016.
- Summary:
- Annotation the scope of the conference is electronic based circuits and system testing, including VLSI Test, VLSI Reliability, Yield, diagnosis, DFX, Verification, etc.
- Contents:
- [Front cover]
- [Blank page]
- [Title page]
- [Copyright notice]
- ETS 2016 foreword
- ETS 2016 organizing committee
- ETS 2016 steering and program committees
- ETS 2015 best paper
- ETS 2016 sponsors
- Securely connected vehicles - what it takes to make self-driving cars a reality
- Compressor design for silicon debug
- An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-4673-9659-1
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