2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) : Sant Feliu de Guíxols, Spain, July 4-6, 2016 / Institute of Electrical and Electronics Engineers.

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author, issuing body.

Language:

English

Subjects (All):

Mixed signal circuits--Design and construction.

Mixed signal circuits.

Physical Description:

1 online resource : illustrations

Other Title:

2016 IEEE 21st International Mixed-Signal Testing Workshop

Place of Publication:

Piscataway, NJ : IEEE, 2016.

Summary:

Annotation The International Mixed Signal Testing Workshop (IMSTW) is one of the main forums that bring together analog, mixed signal, RF, and MEMS the test community to discuss ideas and views on the above challenges The scope of the workshop includes, but is not limited to, the following topics Test generation Fault modeling and simulation Test metrics estimation Self healing and self adaptation Built in self test Design for test Fault diagnosis Failure analysis Defect characterization ATE technology Economics of test and yield optimization On line test Fault tolerance Reliability and design for reliability.

Contents:

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) - cover

Chairs' welcome

Committees

Technical program

Sponsors

Efficient calibration of contact-less resonant bio-sensor affected by operating conditions

Characterization of temperature sensors using Peltier cells

Statistically enhanced analogue and mixed-signal design and test

Post silicon validation of analog/mixed signal/RF circuits and systems: recent advances

Using distortion shaping technique to equalize ADC THD performance between ATEs.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

1-5090-2751-3