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2016 IEEE 25th North Atlantic Test Workshop (NATW) / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Embedded computer systems--Congresses.
- Embedded computer systems.
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Physical Description:
- 1 online resource (x, 59 pages) : illustrations
- Other Title:
- 2016 IEEE 25th North Atlantic Test Workshop
- Place of Publication:
- Piscataway, N.J. : IEEE, 2016.
- Summary:
- Discussion of latest issues relating to test methodologies and design.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-4673-8949-8
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