2016 35th Chinese Control Conference (CCC) / Institute of Electrical and Electronics Engineers.

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author, issuing body.

Language:

English

Subjects (All):

Automatic control--Congresses.

Automatic control.

Physical Description:

1 online resource

Other Title:

2016 35th Chinese Control Conference

Place of Publication:

Piscataway, N.J. : IEEE, 2016.

Summary:

Motivated by applications in fault/attack detection of engineering systems, we formulate in this paper a parameterized switched linear systems identification problem. First, we show that the identifiability of parameterized switched linear systems is equivalent to the global identifiability of a parameterized linear time-invariant system. We propose a new necessary and sufficient condition to check the identifiability of a parameterized linear time-invariant system. Second, using the prior knowledge that the difference between the nominal system and the perturbed system is small (with only a small number of parameters that have been changed), we formulate the fault localization problem as a sparse linear regression problem. We investigate the performance of the proposed algorithm when there is a finite number of samples, and propose a necessary and sufficient condition to determine the number of samples required to achieve a "close-to-true" solution. Potential applications of this work can be: a. development of a sensor placement strategy as well as a real-time monitoring algorithm for the early detection of faults (e.g., material aging, line tripping) or attacks in power grids; b. understanding the functionality of genes, proteins and metabolites in disease dynamics, which could potentially lead to early disease detection and drug design.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

988-15-6391-7

988-15639-1-7