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2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) / Institute of Electrical and Electronics Engineers.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Author/Creator:
Institute of Electrical and Electronics Engineers, author, issuing body.
Language:
English
Subjects (All):
Integrated circuits.
Integrated circuits--Testing--Congresses.
Physical Description:
1 online resource
Other Title:
2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
Place of Publication:
Piscataway, NJ : IEEE, 2016.
Summary:
DDECS covers the areas of design and test of electronic components, circuits and systems, both digital and analog The selected topics are ASIC FPGA Design, Design Verification Validation, Hardware Software Co Design, Logic Synthesis, Defect Fault Tolerance and Reliability, Analog, Mixed Signal, RF Design and Test, Design for Testability and Diagnosis, SoC and NoC Design and Test, Embedded Systems, Dependable HW SW Systems.
Notes:
Description based on publisher supplied metadata and other sources.
ISBN:
1-5090-2467-0

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