My Account Log in

1 option

2016 32nd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) : San Jose, CA, USA, March 14-17, 2016 / IEEE.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

View online
Format:
Book
Author/Creator:
Institute of Electrical and Electronics Engineers, author, issuing body.
Language:
English
Subjects (All):
Semiconductors--Thermal properties--Congresses.
Semiconductors.
Physical Description:
1 online resource : illustrations
Other Title:
2016 32nd Thermal Measurement, Modeling & Management Symposium
Place of Publication:
Piscataway, NJ : IEEE, 2016.
Notes:
Description based on publisher supplied metadata and other sources.
ISBN:
9781509023363
1509023364

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account