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2012 IEEE Autotestcon
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Automatic test equipment--Congresses.
- Automatic test equipment.
- Maintainability (Engineering).
- Physical Description:
- 1 online resource
- Place of Publication:
- [Place of publication not identified] IEEE 2012
- Language Note:
- English
- Contents:
- [Cover]
- [Copyright notice]
- Table of contents
- [Front matter]
- Preserving test program set (TPS) performance after legacy automated test equipment (ATE) upgrade
- A novel approach to RF/microwave stimulus for legacy ATE
- CASS / VDATS interoperability exploration
- Test Strategies for minimizing the overall cost of test in moving from "cost based/government furnished equipment" to "firm fixed price" contracts
- Component obsolescence management model for long life cycle embedded system
- Test means at airbus military: Covering the aircraft test life-cycle with a common and standard approach
- Life cycle planning from product development to long term sustainment.
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781467307000
- 1467307009
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