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2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
- Format:
- Book
- Author/Creator:
- IEEE Staff, Corporate Author.
- Language:
- English
- Subjects (All):
- Integrated circuits--Defects--Congresses.
- Integrated circuits.
- Integrated circuits--Design and construction--Congresses.
- Physical Description:
- 1 online resource (408 pages)
- Place of Publication:
- [Place of publication not identified] IEEE 2012
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781467309837
- 1467309834
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