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2008 Design, Automation, and Test in Europe : Munich, Germany, 10-14 March 2008

ACM Digital Library Available online

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IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Author/Creator:
Sciuto, Donatella
Design, Automation, and Test in Europe Conference and Exhibition, Corporate Author.
Contributor:
Institute of Electrical and Electronics Engineers, Content Provider.
Conference Name:
Design, Automation, and Test in Europe Conference and Exhibition (2008 : Munich, Germany)
Design, Automation, and Test in Europe Conference and Exhibition
Series:
ACM Conferences
Language:
English
Subjects (All):
Electronic systems--Design and construction--Congresses.
Electronic systems.
Electronic circuit design--Data processing--Congresses.
Electronic circuit design.
Computer-aided design--Automation--Congresses.
Computer-aided design.
Electronic industries--Congresses.
Electronic industries.
Physical Description:
1 online resource (1575 p.;)
Other Title:
DATE '08
Place of Publication:
[Place of publication not identified] IEEE 2008
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph

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