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2012 IEEE International Conference on Microelectronic Test Structure
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Electronic apparatus and appliances--Testing.
- Electronic apparatus and appliances.
- Integrated circuits--Testing.
- Integrated circuits.
- Physical Description:
- 1 online resource
- Place of Publication:
- [Place of publication not identified] IEEE 2012
- Language Note:
- English
- Contents:
- [Front matter]
- Table of contents
- Session 1: Design margin
- Ring oscillator with calibration circuit for accurate on-chip IR-drop measurement
- Calibration of library element optimization to improve static power
- A novel structure of MOSFET array to measure off-leakage current with high accuracy
- A universal test structure for the direct measurement of the design margin of even-stage ring oscillators with CMOS latch
- Session 2: Variability
- Inhomogeneous ring oscillator for WID variability and RTN characterization
- Addressable test structures for MOSFET variability analysis.
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781467310307
- 1467310301
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