1 option
2012 23rd Annual SEMI Advanced Semiconductor Manufacturing Conference
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Language:
- English
- Subjects (All):
- Process control--Congresses.
- Semiconductor industry--Management.
- Physical Description:
- 1 online resource
- Place of Publication:
- [Place of publication not identified] IEEE 2012
- Language Note:
- English
- Contents:
- ASMC 2012 proceedings produced by: semi [advertisement]
- Organizing Committee
- Corporate sponsors
- Table of contents
- Identifying systematic critical features using silicon diagnosis data
- Using selective voltage binning to maximize yield
- Analytic modeling of AC response to FET-level elements for CLY optimization
- Optimizing product yield using manufacturing defect weights
- Improving yield learning by electrical fault inspection
- Innovative approach to identify location of AMC source in cleanroom by inverse Computational Fluid Dynamics modeling
- Managing variability within wafertest production by combining lean and six sigma.
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781467303514
- 1467303518
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.