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Twenty Sixth Annual IEEE Semiconductor Thermal Measurement and Management : Symposium proceedings 2010 : Santa Clara, CA USA, February 21-25, 2010 / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Semiconductors--Thermal properties.
- Semiconductors.
- Physical Description:
- 1 online resource (vii, 310 pages) : illustrations
- Other Title:
- 2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium
- Place of Publication:
- Piscataway, NJ : IEEE, [2010]
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-4244-9460-5
- 1-4244-9461-3
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