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Proceedings : 2010 19th IEEE Asian Test Symposium : ATS 2010 : 1-4 December 2010, Shanghai, China / [sponsored by IEEE Computer Society Test Technology Council].
- Format:
- Book
- Conference/Event
- Conference Name:
- Asian Test Symposium (19th : 2010 : Shanghai, China)
- Language:
- English
- Subjects (All):
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Electronic circuits--Testing--Congresses.
- Electronic circuits.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Physical Description:
- xviii, 453 p. : ill. ; 28 cm.
- Other Title:
- 19th Asian Test Symposium
- Asian Test Symposium
- ATS 2010
- Place of Publication:
- IEEE
- Notes:
- "IEEE Computer Society Order Number P4248"--T.p. verso.
- Includes bibliographical references and author index.
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