2010 Design, Automation and Test in Europe Conference and Exhibition

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author.

Contributor:

ieee, Contributor.

Language:

English

Subjects (All):

Computer-aided design--Congresses.

Computer-aided design.

Physical Description:

1 online resource

Place of Publication:

[Place of publication not identified] IEEE 2010

Language Note:

English

Summary:

This panel session will address the post-CMOS research great challenges and opportunities corresponding to the More Than Moore and Beyond CMOS domains. The opening talk of the panel will set the ground for discussion with some key examples placed at the intersection of the two domains. Especially the role of functional diversification and of new research and application drivers, different from scaling, will be critically discussed by a team of high-level experts in the field. Moreover, the impact of post-CMOS era on the way the academic research and the education of engineering are conceived today and should be adapted in the future will be the center of the debate.

Notes:

Bibliographic Level Mode of Issuance: Monograph