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2007 IEEE International Integrated Reliability Workshop Final Report : 15-18 October 2007, S. Lake Tahoe, CA, USA / IEEE Electron Devices Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Integrated Reliability Workshop Final Report (2007 : S. Lake Tahoe, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Reliability--Wafer-scale integration--Congresses.
- Physical Description:
- 1 online resource (x, 168 pages)
- Other Title:
- Some providers have title as : 2007 Institute of Electrical and Electronics Engineers International Integrated Reliability Workshop Final Report
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2007.
- Notes:
- Includes index.
- Description based on: online resource; title from pdf title page (IEEE Xplore, viewed June 6, 2020).
- ISBN:
- 1-5090-8459-2
- 9781424417726
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