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2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Author/Creator:
- IEEE Staff, Corporate Author.
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Physical Description:
- 1 online resource
- Place of Publication:
- [Place of publication not identified] I E E E 2010
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781424455980
- 1424455987
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