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MTDT 2009 : 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan
- Format:
- Book
- Conference/Event
- Author/Creator:
- IEEE International Workshop on Memory Technology, Design and Testing, Corporate Author.
- Conference Name:
- IEEE International Workshop on Memory Technology, Design, and Testing (17th : 2009 : Hsinchu City, Taiwan)
- IEEE International Workshop on Memory Technology, Design, and Testing
- Language:
- English
- Subjects (All):
- Semiconductor storage devices--Testing--Congresses.
- Semiconductor storage devices.
- Random access memory--Congresses.
- Random access memory.
- Place of Publication:
- [Place of publication not identified] IEEE Computer Society 2009
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781509073351
- 1509073353
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