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ATS 2009 : proceedings : 2009 Asian Test Symposium : 23-26 November 2009, Taichung, Taiwan.
- Format:
- Book
- Conference/Event
- Conference Name:
- Asian Test Symposium (2009 : Taichung City, Taiwan)
- Language:
- English
- Subjects (All):
- Electronic circuits--Testing--Congresses.
- Electronic circuits.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Physical Description:
- 1 online resource (xxv, 465 pages)
- Place of Publication:
- New York : IEEE, 2009.
- Notes:
- Includes index.
- Description based on: online resource; title from pdf title page (IEEE Xplore Digital Library, viewed March 5, 2018).
- ISBN:
- 1-5090-7541-0
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