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2008 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
- Format:
- Book
- Author/Creator:
- IEEE Staff, Corporate Author.
- Language:
- English
- Place of Publication:
- [Place of publication not identified] I E E E 2008
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781509077205
- 1509077200
- 9781424420407
- 1424420407
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