1 option
2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT)
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, Inc Staff, author, issuing body.
- Language:
- English
- Subjects (All):
- Random access memory.
- Physical Description:
- 1 online resource
- Place of Publication:
- [Place of publication not identified] I E E E 2007
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781509090501
- 1509090509
- 9781424416554
- 1424416558
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