1 option
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis : 28-29 April 2009.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE Circuits and Systems International Conference on Testing and Diagnosis (2009 : Chengdu, China)
- Language:
- English
- Subjects (All):
- Computer programs--Testing--Congresses.
- Computer programs.
- Automatic test equipment--Congresses.
- Automatic test equipment.
- Physical Description:
- 1 online resource (430 pages)
- Place of Publication:
- New York : IEEE, 2009.
- Notes:
- Description based on: online resource; title from title screen (IEEE Xplore Digital Library, viewed March 6, 2018).
- ISBN:
- 1-5090-6813-9
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