1 option
2008 3rd International Design and Test Workshop : 20-22 December 2008.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Design and Test Workshop (3rd : 2008 : Munastīr, Tunisia)
- Language:
- English
- Subjects (All):
- Integrated circuits--Design and construction--Congresses.
- Integrated circuits.
- Integrated circuits--Testing--Congresses.
- Physical Description:
- 1 online resource (359 pages)
- Place of Publication:
- New York : IEEE, 2009.
- Notes:
- Includes index.
- Description based on: online resource; title from title screen (IEEE Xplore Digital Library, viewed March 5, 2018).
- ISBN:
- 1-5090-8036-8
- 1-4244-3478-5
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