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4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) : 23-25 January 2008, Hong Kong, China / IEEE Computer Society.
- Format:
- Book
- Conference/Event
- Author/Creator:
- IEEE International Symposium on Electronic Design, Test and Applications, Corporate Author.
- Conference Name:
- IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) (4th : 2008 : Hong Kong, China)
- IEEE International Symposium on Electronic Design, Test and Applications
- Language:
- English
- Subjects (All):
- Electronics--Design--Congresses.
- Electronics.
- Electronics--Testing--Congresses.
- Genre:
- Electronic books.
- Physical Description:
- 1 online resource (84 pages)
- Other Title:
- Some providers have title as : Fourth Institute of Electrical and Electronics Engineers International Symposium on Electronic Design, Test and Applications (delta 2008)
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2008.
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- Description based on: online resource; title from pdf title page (IEEE Xplore, viewed June 6, 2020).
- ISBN:
- 1-5090-7977-7
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