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Ninth International Symposium on Quality Electronic Design : ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Author/Creator:
International Symposium on Quality Electronic Design, Corporate Author.
Contributor:
IEEE Circuits and Systems Society, Content Provider.
IEEE Electron Devices Society, Content Provider.
Synopsys (Firm), Content Provider.
Conference Name:
International Symposium on Quality Electronic Design (9th : 2008 : San Jose, Calif.)
Language:
English
Subjects (All):
Integrated circuits--Reliability--Very large scale integration--Congresses.
Integrated circuits.
Integrated circuits--Design and construction--Very large scale integration--Congresses.
Integrated circuits--Computer-aided design--Very large scale integration--Congresses.
Integrated circuits--Quality control--Testing--Very large scale integration--Congresses.
Place of Publication:
[Place of publication not identified] IEEE Computer Society 2008
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
9781509083435
150908343X

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