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Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Author/Creator:
International Workshop on Microprocessor Test and Verification, Corporate Author.
Contributor:
IEEE Computer Society Technical Council on Test Technology., Content Provider.
IEEE Xplore (Online service), Content Provider.
Conference Name:
International Workshop on Microprocessor Test and Verification (6th : 2005 : Austin, Tex.)
International Workshop on Microprocessor Test and Verification
Language:
English
Subjects (All):
Microprocessors--Testing--Congresses.
Microprocessors.
Integrated circuits--Testing--Congresses.
Integrated circuits.
Integrated circuits--Verification--Congresses.
Systems on a chip--Testing--Congresses.
Systems on a chip.
Place of Publication:
[Place of publication not identified] IEEE Computer Society 2005
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
9781509097432
1509097430

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