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Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2006
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Symposium on the Physical & Failure Analysis of Integrated Circuits, Corporate Author.
- Conference Name:
- International Symposium on the Physical & Failure Analysis of Integrated Circuits (13th : 2006 : Singapore)
- International Symposium on the Physical & Failure Analysis of Integrated Circuits
- Language:
- English
- Subjects (All):
- Integrated circuits--Defects--Congresses.
- Integrated circuits.
- Integrated circuits--Testing--Congresses.
- Integrated circuits--Reliability--Congresses.
- Place of Publication:
- [Place of publication not identified] IEEE 2006
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781509095957
- 1509095950
- 9781424402069
- 1424402069
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