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2006 IEEE International Test Conference : Santa Clara, CA : 22-27 October 2006.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Test Conference (37th : 2006 : Santa Clara, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Telecommunication--Congresses.
- Telecommunication.
- Radio frequency--Congresses.
- Radio frequency.
- Other Title:
- Autonomic Computing
- 2006 IEEE International Test Conference
- Place of Publication:
- IEEE
- ISBN:
- 9781509090884
- 1509090886
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