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2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Integrated Reliability Workshop, Corporate Author.
- Conference Name:
- International Integrated Reliability Workshop (2006 : South Lake Tahoe, Calif.)
- International Integrated Reliability Workshop
- Language:
- English
- Subjects (All):
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Reliability--Wafer-scale integration--Congresses.
- Place of Publication:
- [Place of publication not identified] Electron Devices Society 2006
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781509090969
- 1509090967
- 9781424402977
- 1424402972
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