1 option
VTS 2008 : proceedings : 26th IEEE VLSI Test Symposium : San Diego, California, 27 April - 1 May 2008.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE VLSI Test Symposium (26th : 2008 : San Diego, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing--Congresses.
- Integrated circuits.
- Physical Description:
- 1 online resource (xxx, 413 pages)
- Place of Publication:
- New York : IEEE, 2008.
- Notes:
- Description based on: online resource; title from pdf title page (IEEE Xplore Digital Library, viewed March 17, 2018).
- ISBN:
- 1-5090-8176-3
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