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DFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy
- Format:
- Book
- Conference/Event
- Author/Creator:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Corporate Author.
- Conference Name:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (22nd : 2007 : Rome, Italy)
- IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
- Language:
- English
- Subjects (All):
- Integrated circuits--Design and construction--Very large scale integration--Congresses.
- Integrated circuits.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Place of Publication:
- [Place of publication not identified] IEEE Computer Society Press 2007
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781509088577
- 1509088571
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