The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing.

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author.

Contributor:

Bolchini, Cristiana, editor.

Kim, Yŏng-bin, editor.

Gizopoulos, Dimitris, editor.

Tehranipoor, Mohammad H., 1974- editor.

IEEE Computer Society. Technical Council on Test Technology, sponsoring body.

IEEE Computer Society. Fault-Tolerant Computing Technical Committee, sponsoring body.

Language:

English

Subjects (All):

Integrated circuits--Very large scale integration--Design and construction--Congresses.

Integrated circuits.

Fault-tolerant computing--Congresses.

Fault-tolerant computing.

Physical Description:

1 online resource (xxxi, 545 pages)

Place of Publication:

New York : IEEE, 2008.

Notes:

Includes index.

Description based on: online resource; title from pdf title page (IEEE Xplore Digital Library, viewed March 2, 2018).

ISBN:

9781509084418

150908441X