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Testing: Academic and Industry Conference--Practice and Research Techniques : TAIC PART 2008 : 29-31, August 2008, Windsor, United Kingdom ; sponsored by EPSRC ... [et a.l].

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Author/Creator:
Testing: Academic & Industrial Conference--Practice and Research Techniques, Corporate Author.
Contributor:
IEEE Computer Society, Content Provider.
Engineering and Physical Sciences Research Council, Content Provider.
Conference Name:
Testing: Academic & Industrial Conference--Practice and Research Techniques (3rd : 2008 : Windsor, Windsor and Maidenhead, England)
Language:
English
Subjects (All):
Computer software--Testing--Congresses.
Computer software.
Academic-industrial collaboration--Congresses.
Academic-industrial collaboration.
Place of Publication:
[Place of publication not identified] IEEE Computer Society 2008
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
9781509076642
1509076646

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