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NDCS 2008 : IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : proceedings, 29-30 September 2008, Cambridge, Massachusetts

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Author/Creator:
IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems, Corporate Author.
Contributor:
IEEE Computer Society Technical Council on Test Technology., Content Provider.
IEEE Computer Society, Content Provider.
Conference Name:
IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems (2008 : Cambridge, Mass.)
Language:
English
Subjects (All):
Nanoelectromechanical systems--Design--Congresses.
Nanoelectromechanical systems.
Nanoelectromechanical systems--Testing--Congresses.
Nanoelectronics--Devices--Congresses.
Nanoelectronics.
Nanoelectronics--Testing--Congresses.
Nanostructured materials--Congresses.
Nanostructured materials.
Place of Publication:
[Place of publication not identified] IEEE Computer Society 2008
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
9781509077793
1509077790

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