Asian Test Symposium: 16th: 2007: Beijing, China

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author, issuing body.

Contributor:

IEEE Staff, Contributor.

Language:

English

Subjects (All):

Electronic circuits--Testing.

Electronic circuits.

Physical Description:

1 online resource

Place of Publication:

[Place of publication not identified] IEEE Computer Society Press 2007

Language Note:

English

Summary:

Since scan testing is not based on the function of the circuit, but rather its structure, this method is considered to be a form of over testing or under testing. It is important to test VLSIs using the given function. Since the functional specifications are described explicitly in the FSMs, high test quality is expected by performing logical testing and timing testing. This paper proposes two test generation methods, a fault-independent test generation method and a fault-dependent test generation method, for stateobservable FSMs. We give experimental results for MCNC?91 benchmark circuits. The quality and cost of the logic testing and timing testing for proposed test generation methods was evaluated.

Notes:

Bibliographic Level Mode of Issuance: Monograph

ISBN:

9781509088676

1509088679