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DELTA 2010 : Fifth IEEE International Symposium on Electronic Design, Test & Applications : proceedings : 13-15 January 2010, Ho Chi Minh City, Vietnam

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Author/Creator:
IEEE International Symposium on Electronic Design, Test and Applications, Corporate Author.
Contributor:
IEEE Computer Society, Content Provider.
IEEE Computer Society Technical Council on Test Technology., Content Provider.
£òai hòoc quâãoc gia TP Háão Châi Minh, Content Provider.
IEEE Vietnam Section, Content Provider.
Conference Name:
IEEE International Symposium on Electronic Design, Test and Applications (5th : 2010 : Ho Chi Minh City, Vietnam)
IEEE International Symposium on Electronic Design, Test and Applications.
Language:
English
Subjects (All):
Electronics--Research--Congresses.
Electronics.
Electronics--Design--Congresses.
Electronics--Testing--Congresses.
Place of Publication:
[Place of publication not identified] IEEE Computer Society 2010
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
9781424460267
1424460263

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