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Proceedings, 2009 Testing: Academic and Industrial Conference Practice and Research Techniques : TAIC PART 2009 : 4-6 September 2009 : [Cumberland Lodge], Windsor, United Kingdom

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Author/Creator:
Testing: Academic & Industrial Conference--Practice and Research Techniques, Corporate Author.
Contributor:
IEEE Computer Society, Content Provider.
Institute of Electrical and Electronics Engineers, Content Provider.
Conference Name:
Testing: Academic & Industrial Conference--Practice and Research Techniques (4th : 2009 : Windsor, Windsor and Maidenhead, England)
Testing: Academic & Industrial Conference--Practice and Research Techniques.
Language:
English
Subjects (All):
Computer software--Testing--Congresses.
Computer software.
Place of Publication:
[Place of publication not identified] IEEE Computer Society 2009
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph

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