The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council.

Format:

Book

Conference/Event

Contributor:

Gizopoulos, Dimitris, editor.

Tehranipoor, Mohammad H., 1974- editor.

Tragoudas, Spyros, editor.

IEEE Computer Society. Fault-Tolerant Computing Technical Committee, sponsoring body.

IEEE Computer Society. Technical Council on Test Technology, sponsoring body.

Conference Name:

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (24th : 2009 : Chicago, Ill.)

Language:

English

Subjects (All):

Fault-tolerant computing--Congresses.

Fault-tolerant computing.

Integrated circuits--Very large scale integration--Design and construction--Congresses.

Integrated circuits.

Physical Description:

1 online resource (xxxi, 455 pages)

Place of Publication:

New York : IEEE, 2009.

Notes:

Includes index.

Description based on: online resource; title from pdf title page (IEEE Xplore Digital Library, viewed March 5, 2018).

ISBN:

1-5090-7533-X