International On-Line Testing Symposium: Crete, Greece - 2007

Format:

Book

Author/Creator:

IEEE Computer Society, author, issuing body.

Language:

English

Subjects (All):

Electronic circuits--Testing--Data processing--Congresses.

Electronic circuits.

Error-correcting codes (Information theory)--Congresses.

Error-correcting codes (Information theory).

Physical Description:

1 online resource : illustrations

Place of Publication:

[Place of publication not identified] IEEE Computer Society Press 2007

Language Note:

English

Contents:

13th IEEE International On-Line Testing Symposium - Cover

13th IEEE International On-Line Testing Symposium-Title

13th IEEE International On-Line Testing Symposium-Copyright

13th IEEE International On-Line Testing Symposium - TOC

Message from the General Co-Chairs and the Program Co-Chairs

Organizing Committee

Program Committee

IEEE Computer Society TTTC: Test Technology Technical Council

Soft Errors: Technology Trends, System Effects, and Protection Techniques

Soft-Errors Phenomenon Impacts on Design for Reliability Technologies

Accelerating Yield Ramp through Real-Time Testing

Fuse: A Technique to Anticipate Failures due to Degradation in ALUs

Design for Resilience to Soft Errors and Variations

Defect-Aware Configurable Computing in Nanoscale Crossbar for Improved Yield

Essential Fault-Tolerance Metrics for NoC Infrastructures

Configurable Error Control Scheme for NoC Signal Integrity

An Analytical Model for Reliability Evaluation of NoC Architectures

An On-Line Fault Detection Scheme for SBoxes in Secure Circuits.

Notes:

Bibliographic Level Mode of Issuance: Monograph

ISBN:

9781509083312

1509083316