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Testing: Academic and Industrial Conference--Practice And Research Techniques : (TAIC PART 2007) : co-located with Mutation 2007 : proceedings : 10th-14th September, 2007, Cumberland Lodge, Windsor, United Kingdom

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Author/Creator:
Testing: Academic & Industrial Conference--Practice and Research Techniques, Corporate Author.
Contributor:
Engineering and Physical Sciences Research Council, Content Provider.
Certess, Inc, Content Provider.
Conference Name:
Testing: Academic & Industrial Conference--Practice and Research Techniques (2nd : 2007 : Windsor, Windsor and Maidenhead, England)
Testing: Academic & Industrial Conference--Practice and Research Techniques.
Language:
English
Subjects (All):
Computer software--Testing--Congresses.
Computer software.
Place of Publication:
[Place of publication not identified] IEEE Computer Society 2007
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
9781509085033
1509085033

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