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Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 18-21, 2007, Kraków, Poland / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Silesian University of Technology ; editors, P. Girard ... [et al.].

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Contributor:
IEEE Computer Society. Technical Council on Test Technology.
Politechnika Śląska im. W. Pstrowskiego.
Girard, Patrick, Ph. D.
Conference Name:
IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (10th : 2007 : Kraków, Poland)
Language:
English
Subjects (All):
Integrated circuits--Testing--Congresses.
Integrated circuits.
Integrated circuits--Design--Congresses.
Other Title:
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems
Internet Monitoring and Protection
Place of Publication:
IEEE
ISBN:
9781509086580
1509086587

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